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Features
? DLA SMD #5962-15219
? Fabricated using P6SOI process technology
? ESD protection 8kV (HBM)
? Rail-to-rail operation
? Overvoltage protection
? Low rON. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .<500Ω (typical)
? Flexible split rail operation
- Positive supply above GND (V+) . . . . . . . +10.8V to +16.5V
- Negative supply below GND (V-) . . . . . . . . -10.8V to -16.5V
? Adjustable logic threshold control with VREF pin
? Cold sparing capable (from ground). . . . . . . . . . . . . . . . .±25V
? Analog overvoltage range (from ground) . . . . . . . . . . . . .±35V
? Off switch leakage . . . . . . . . . . . . . . . . . . . 100nA (maximum)
? Transition times (tR, tF) . . . . . . . . . . . . . . . . . . . 500ns (typical)
? Break-before-make switching
? Grounded metal lid (internally connected)
? Operating temperature range. . . . . . . . . . . .-55°C to +125°C
? Radiation tolerance
- Low dose rate (0.01rad(Si)/s) . . . .50krad(Si) (see Note 1)
- SEB LETTH . . . . . . . . . . . . . . . . . . . . . . . . .86.4 MeV?cm2/mg
NOTE:
1. Product capability established by initial characterization. All
subsequent lots are assurance tested to 50krad (0.01rad(Si)/s)
wafer-by-wafer.