NE5537

Sample-and-hold amplifier

DESCRIPTION TheNE5537monolithicsample-and-holdamplifiercombinesthebestfeaturesofion-implantedJFETswithbipolardevicestoobtainhighaccuracy,fastacquisitiontime,andlowdrooprate.Thisdeviceispin-compatiblewiththeLF198,andfeaturessuperiorperformanceindroopratean

PHI

NE5537

Sample-and-hold amplifier

恩XP

NE5537D

Sample-and-hold amplifier

DESCRIPTION\nThe NE5537 monolithic sample-and-hold amplifier combines the best features of ion-implanted JFETs with bipolar devices to obtain high accuracy, fast acquisition time, and low droop rate. This device is pin-compatible with the LF198, and features superior performance in droop rate and ou; ?Operates from ±5V to ±18V supplies\n?Hold leakage current 6pA @ TJ= 25°C\n?Less than 4μs acquisition time\n?TTL, PMOS, CMOS compatible logic input\n?0.5mV typical hold step at CH=0.01μF\n?Low input offset: 1MV (typical)\n?0.002% gain accuracy with RL=2k?\n?Low output noise in hold mode\n?Input ;

恩XP

NE5537D

Sample-and-hold amplifier

DESCRIPTION TheNE5537monolithicsample-and-holdamplifiercombinesthebestfeaturesofion-implantedJFETswithbipolardevicestoobtainhighaccuracy,fastacquisitiontime,andlowdrooprate.Thisdeviceispin-compatiblewiththeLF198,andfeaturessuperiorperformanceindroopratean

PHI

NE5537N

Sample-and-hold amplifier

DESCRIPTION TheNE5537monolithicsample-and-holdamplifiercombinesthebestfeaturesofion-implantedJFETswithbipolardevicestoobtainhighaccuracy,fastacquisitiontime,andlowdrooprate.Thisdeviceispin-compatiblewiththeLF198,andfeaturessuperiorperformanceindroopratean

PHI