TN28F001BX-B90中文資料英特爾數(shù)據(jù)手冊(cè)PDF規(guī)格書(shū)

Intel’s 28F001BX-B and 28F001BX-T combine the cost-effectiveness of Intel standard flash memory with features that simplify write and allow block erase. These devices aid the system designer by combining the functions of several components into one, making boot block flash an innovative alternative to EPROM and EEPROM or battery-backed static RAM. Many new and existing designs can take advantage of the 28F001BX’s integration of blocked architecture, automated electrical reprogramming, and standard processor interface.

■ High-Integration Blocked Architecture

— One 8 KB Boot Block w/Lock Out

— Two 4 KB Parameter Blocks

— One 112 KB Main Block

■ 100,000 Erase/Program Cycles Per Block

■ Simplified Program and Erase

— Automated Algorithms via On-Chip Write State Machine (WSM)

■ SRAM-Compatible Write Interface

■ Deep Power-Down Mode

— 0.05 mA ICC Typical

— 0.8 mA IPP Typical

■ 12.0V g5 VPP

■ High-Performance Read

— 70/75 ns, 90 ns, 120 ns, 150 ns Maximum Access Time

— 5.0V g10 VCC

■ Hardware Data Protection Feature

— Erase/Write Lockout during Power Transitions

■ Advanced Packaging, JEDEC Pinouts

— 32-Pin PDIP

— 32-Lead PLCC, TSOP

■ ETOXTM II Nonvolatile Flash Technology

— EPROM-Compatible Process Base

— High-Volume Manufacturing Experience

■ Extended Temperature Options